Sensor |
Wavelength Range (nm) | 200 - 1100 | 400 - 1100 | 700 - 1800 | 1000 - 2700 | 200 - 1100 | 400 - 1100 | 700 - 1800 | 1000 - 2700 |
Detector Type | Si - UV Enhanced | Si | Ge | Extended InGaAs | Si - UV Enhanced | Si | Ge | Extended InGaAs |
Aperture Diameter | 4 mm | 9 mm |
Scan Method | Scanning Slits |
Slit Size | 2.5 m | 5 m |
Min Beam Diameter | 10 m | 20 m |
Max Beam Diameter | 4 mm | 9 mm* |
Scan Rate | 1.0 - 20.0 per s (continuously variable) |
Sampling Resolution | 0.5 - 38 m (depending on scan rate) | 1.1 - 38 m (depending on scan rate) |
Power Range | 10 nW - 10 W (depending on beam diameter and model) |
Amplifier Bandwidth | 10 to 150 kHz in 10 kHz Steps (@ -1 dB) |
Sample Frequency | 0.0625 - 1.0 MHz |
Dynamic Range | 72 dB (Amplifier Switchable) |
Signal Digitization | 16 bit |
Head Size | 80 mm x 60 mm (including rotation mount) |
Minimum Pulse Rate | 10 Hz (300 kHz if using the M Option) |
Software |
Displayed Parameters/Features | X-Y-Profile, Centroid Position, Peak Position, Pseudo 3D Profile, Beam Width Clip Level/Second Moment (4 ), Gaussian Fit Applicable, Colored Pass/Fail Test |
Compliant to Norm | ISO 11146 (Beam Widths, Divergence Angle and Beam Propagation Factor) |
General System Requirements | Windows 2000/XP/Vista or later, USB2.0 port recommended, 120 MB HD, 512 MB RAM |
M Analysis System |
Compatible M Options | BP1M2-xx Series, M2SET-xxx Series |
Compliant to Norm | ISO 11146 |
Measured Parameters** | M , Waist Width, Waist Position, Rayleigh Length, Divergence, Beam Pointing, Waist Asymmetry, Astigmatism |